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Non-contact Capacitive
Displacement
Measurement System
PS-III
Differential Optical Fibre
Displacement Sensor
ATOPS
Nano Sensor
PM-E
PM-S
Nano-positioning System
Piezo-servo positioner
Lens testing equipment
OTF Measurement System
OTF Production System
OTF Measurement Service
Optical character recognition
MIEZOH MARK III
Motion picture transmission System
Bulk Data Transmission
System
Video/Voice/Data
Transmission
Spectrometer
Microspectrometer
Alignment system
Electronic Autocollimators
Visual autocollimators
Visual testing collimators
Visual testing telescopes
Iron Detectors
Needle Detector
FeaturesSpecificationsApplicationsPrincipleCatalog


Type
ATW-01
Cut-off Frequency (Hz)
100,1K,10K,100K,1M: Optional
Sensitivity Magnification
X1,X2,X5,X10,X20,X50
Display
4 1/2 digit
Analog Output
±10VDC
Power Supply
AC 115V or 230V ,±10%(50/60Hz)
To be specified with order
Ambient Condition
0 to 45°C 20 to 85%RH(With No Condensation)


Module Type
ATP-A20
ATP-B20
ATP-C20
ATP-C05
Light Source
IR Laser Diode (=840nm)
Fibre Length
1m
Operating Temp.at the end of probe
0 to 150°C. (Option for High Temp. :320°C)
Spot dia.(mm)*
0.1
0.4
0.9
0.9
Measuring Range(µm)*
20
50
130
300
Operating Distance(µm)*
80
150
500
1000
Fundamental Sensitivity(µm/V)*
2
5
13
30
*Above characteristics are typical values subject to individual calibration


Magnification
ATP-A20
ATP-B20
ATP-C20
ATP-C05
×1
1.6 7 13 30
×2
0.8 3.5 6.5 15
×5
0.3 1.4 2.6 6
×10
0.16 0.7 1.3 3
×20
0.08
0.35
0.65
1.5
×50
0.03
0.14
0.26
6
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