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Non-contact Capacitive
Displacement
Measurement System
PS-III
Differential Optical Fibre
Displacement Sensor
ATOPS
Nano Sensor
PM-E
PM-S
Nano-positioning System
Piezo-servo positioner
Lens testing equipment
OTF Measurement System
OTF Production System
OTF Measurement Service
Optical character recognition
MIEZOH MARK III
Motion picture transmission System
Bulk Data Transmission
System
Video/Voice/Data
Transmission
Spectrometer
Microspectrometer
Alignment system
Electronic Autocollimators
Visual autocollimators
Visual testing collimators
Visual testing telescopes
Iron Detectors
Needle Detector
FeaturesSpecifications


Model Name
MATRIX Plus MATRIX Plus ER MATRIX IR
Reqeatability of MTF
±1%
Object target
pin-hole slit
Imaging device
CCD Interline Transfer
-
Effective no. of pixels
Max. 1280(H) x 1024(V)
Max. 1344(H) x 1024(V)
1
Cell size
6.7um x 6.7um
6.45um x 6.45um
-
Effective area
8.58mm x 6.86mm
8.58mm x 6.86mm
10um x 10um
Frame rate
9Hz
8.3Hz
-
Output signal
IEEE1394 / RS-422A 10/12-bit -
Waveband
400-800nm
400-1100nm
3-5um,8-12um
Max. Off-Axis angle
±60deg
software
Windows 2000 / XP
Ambient operating temp.
0 to +40 C -
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