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Product Lineup
Non-contact Capacitive
Displacement
Measurement System
PS-III
Differential Optical Fibre
Displacement Sensor
ATOPS
Nano Sensor
PM-E
PM-S
Nano-positioning System
Piezo-servo positioner
Lens testing equipment
OTF Measurement System
OTF Production System
OTF Measurement Service
Optical character recognition
MIEZOH MARK III
Motion picture transmission System
Bulk Data Transmission
System
Video/Voice/Data
Transmission
Spectrometer
Microspectrometer
Alignment system
Electronic Autocollimators
Visual autocollimators
Visual testing collimators
Visual testing telescopes
Iron Detectors
Needle Detector
FeaturesSpecificationsApplicationsSensor ProbePrincipleCatalog



The principle is schematically shown in right figure. The centered electrode is surrounded by the guard electrode for forming a parallel field at the centered electrode. The conductive material is parallel to the end of the probe surface.The capacitance C, between the centered electrode and material is ideally described by C=E0A/g, where E0 is the dielectric constant of vacuum, A the area of the centered electrode, and g the gap. The reciprocal of the capacitance is directly proportional to the gap. g. High stabillty wide-range and high resolution of PS sensor are based on this simple principle and optimized electronics.

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